208 search results - page 32 / 42 » Analog circuit simulation using range arithmetics |
COMPGEOM
2000
ACM
13 years 12 months ago
2000
ACM
Let A be the incidence matrix of a set system with m sets and n points, m ≤ n, and let t = tr M, where M = AT A. Finally, let σ = tr M2 be the sum of squares of the elements of ...
VLSID
2004
IEEE
14 years 8 months ago
2004
IEEE
This paper focuses on the investigation of integrated CMOS and Silicon/Germanium (SiGe) devices for highspeed optical receiver circuits. In this paper, we present several competit...
ISLPED
2009
ACM
14 years 2 months ago
2009
ACM
The theoretical lower limit of subthreshold swing in MOSFETs (60 mV/decade) significantly restricts low voltage operation since it results in a low ON to OFF current ratio at low ...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
VTS
2000
IEEE
13 years 12 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...