135 search results - page 21 / 27 » Analog circuit test based on a digital signature |
ISCAS
2003
IEEE
14 years 3 months ago
2003
IEEE
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
INTEGRATION
2006
13 years 9 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
WCE
2007
13 years 11 months ago
2007
Improving testability during the early stages of High-level synthesis has several advantages including reduced test hardware overhead and design iterations. Recently, BIST techniq...
JCP
2006
13 years 9 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...