135 search results - page 22 / 27 » Analog circuit test based on a digital signature |
NIPS
2003
13 years 10 months ago
2003
A mixed-signal image filtering VLSI has been developed aiming at real-time generation of edge-based image vectors for robust image recognition. A four-stage asynchronous median de...
GLVLSI
2006
IEEE
14 years 2 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
CICC
2011
12 years 8 months ago
2011
Efforts to achieve the long-standing dream of realizing scalable learning algorithms for networks of spiking neurons in silicon have been hampered by (a) the limited scalability of...
VTS
2000
IEEE
14 years 28 days ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
DAC
2005
ACM
13 years 10 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...