A mixed-signal image filtering VLSI has been developed aiming at real-time generation of edge-based image vectors for robust image recognition. A four-stage asynchronous median de...
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
Efforts to achieve the long-standing dream of realizing scalable learning algorithms for networks of spiking neurons in silicon have been hampered by (a) the limited scalability of...
Jae-sun Seo, Bernard Brezzo, Yong Liu, Benjamin D....
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...