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DATE
2010
IEEE
13 years 11 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
MTDT
2003
IEEE
13 years 12 months ago
2003
IEEE
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
CORR
2010
Springer
13 years 6 months ago
2010
Springer
In this paper a new solution is proposed for testing simple stwo stage electronic circuits. It minimizes the number of tests to be performed to determine the genuinity of the circ...
DAC
2005
ACM
14 years 7 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...