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DAC
2008
ACM
14 years 8 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
DAC
2007
ACM
14 years 8 months ago
Implicitly Parallel Programming Models for Thousand-Core Microprocessors
This paper argues for an implicitly parallel programming model for many-core microprocessors, and provides initial technical approaches towards this goal. In an implicitly paralle...
Wen-mei W. Hwu, Shane Ryoo, Sain-Zee Ueng, John H....
ADBIS
1995
Springer
155views Database» more  ADBIS 1995»
13 years 11 months ago
The MaStA I/O Cost Model and its Validation Strategy
Crash recovery in database systems aims to provide an acceptable level of protection from failure at a given engineering cost. A large number of recovery mechanisms are known, and...
S. Scheuerl, Richard C. H. Connor, Ronald Morrison...
ACSAC
2008
IEEE
14 years 2 months ago
Defending Against Attacks on Main Memory Persistence
Main memory contains transient information for all resident applications. However, if memory chip contents survives power-off, e.g., via freezing DRAM chips, sensitive data such a...
William Enck, Kevin R. B. Butler, Thomas Richardso...
PLDI
2011
ACM
12 years 10 months ago
EnerJ: approximate data types for safe and general low-power computation
Energy is increasingly a first-order concern in computer systems. Exploiting energy-accuracy trade-offs is an attractive choice in applications that can tolerate inaccuracies. Re...
Adrian Sampson, Werner Dietl, Emily Fortuna, Danus...