118 search results - page 13 / 24 » Analysis and modeling of CD variation for statistical static... |
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Deterministic gate delay models have been widely used to find the transition probabilities at the nodes of a circuit for calculating the power dissipation. However, with progress...
SOCC
2008
IEEE
14 years 2 months ago
2008
IEEE
— Several design metrics have been used in the past to evaluate the SRAM cell stability. However, most of them fail to provide the exact stability figures as shown in this paper...
JSS
2000
13 years 7 months ago
2000
The upstream activities of software development projects are often viewed as both the most important, the least understood, and hence the most problematic. This is particularly no...
TCAD
2010
13 years 2 months ago
2010
The Monte-Carlo (MC) technique is a traditional solution for a reliable statistical analysis, and in contrast to probabilistic methods, it can account for any complicate model. How...
DATE
2010
IEEE
14 years 22 days ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...