118 search results - page 14 / 24 » Analysis and modeling of CD variation for statistical static... |
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
VTS
2000
IEEE
14 years 18 hour ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
SAC
2006
ACM
14 years 1 months ago
2006
ACM
: In chip design, one of the main objectives is to decrease its clock cycle; however, the existing approaches to timing analysis under uncertainty are based on fundamentally restri...
TCAD
2010
13 years 2 months ago
2010
PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— Continuing scaling of CMOS technology has allowed aggressive pursuant of increased clock rate in DSM chips. The ever shorter clock period has made switching times of di...