67 search results - page 4 / 14 » Analysis of multibackground memory testing techniques |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Built-in self-repair (BISR) technique is gaining popular for repairing embedded memory cores in system-onchips (SOCs). To increase the utilization of memory redundancy, the BISR t...
AC
2005
Springer
13 years 7 months ago
2005
Springer
Reducing power consumption has become a major challenge in the design and operation of today's computer systems. This chapter describes different techniques addressing this c...
PLDI
2010
ACM
14 years 23 days ago
2010
ACM
Multithreaded programs are notoriously prone to race conditions, a problem exacerbated by the widespread adoption of multi-core processors with complex memory models and cache coh...
FDTC
2010
Springer
13 years 5 months ago
2010
Springer
This paper introduces some new types of optical fault attacks called fault masking attacks. These attacks are aimed at disrupting of the normal memory operation through preventing ...
TSE
2011
13 years 2 months ago
2011
—Conventional testing methods often fail to detect hidden flaws in complex embedded software such as device drivers or file systems. This deficiency incurs significant developmen...