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DAC
2003
ACM
14 years 8 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
KDD
2006
ACM
272views Data Mining» more  KDD 2006»
14 years 8 months ago
YALE: rapid prototyping for complex data mining tasks
KDD is a complex and demanding task. While a large number of methods has been established for numerous problems, many challenges remain to be solved. New tasks emerge requiring th...
Ingo Mierswa, Michael Wurst, Ralf Klinkenberg, Mar...
ZUM
1997
Springer
125views Formal Methods» more  ZUM 1997»
13 years 11 months ago
A Formal OO Method Inspired by Fusion and Object-Z
We present a new formal OO method, called FOX, which is a synergetic combination of the semi-formal Fusion method and the formal specification language Object-Z. To manage complex...
Klaus Achatz, Wolfram Schulte
JSS
2007
105views more  JSS 2007»
13 years 7 months ago
Composing pattern-based components and verifying correctness
Designing large software systems out of reusable components has become increasingly popular. Although liberal composition of reusable components saves time and expense, many exper...
Jing Dong, Paulo S. C. Alencar, Donald D. Cowan, S...
DDECS
2007
IEEE
175views Hardware» more  DDECS 2007»
14 years 1 months ago
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...