As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
KDD is a complex and demanding task. While a large number of methods has been established for numerous problems, many challenges remain to be solved. New tasks emerge requiring th...
Ingo Mierswa, Michael Wurst, Ralf Klinkenberg, Mar...
We present a new formal OO method, called FOX, which is a synergetic combination of the semi-formal Fusion method and the formal specification language Object-Z. To manage complex...
Designing large software systems out of reusable components has become increasingly popular. Although liberal composition of reusable components saves time and expense, many exper...
Jing Dong, Paulo S. C. Alencar, Donald D. Cowan, S...
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...