1398 search results - page 128 / 280 » Application-Specific Integrated Circuits |
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
—Bug-free first silicon is not guaranteed by the existing pre-silicon verification techniques. To have impeccable products, it is now required to identify any bug as soon as the ...
DELTA
2002
IEEE
14 years 1 months ago
2002
IEEE
The European network for Integrated Circuit testing education described in this paper addresses the shortage of skill in mixed-signal production testing by encouraging students...
DAC
1997
ACM
14 years 9 days ago
1997
ACM
This paper describes a new design methodology to analyze the on-chip power supply noise for high performance microprocessors. Based on an integrated package-level and chip-level p...
ISLPED
1997
ACM
14 years 9 days ago
1997
ACM
With the increasing performance and density of VLSI circuits as well as the popularity of portable devices such as personal digital assistance, power consumption has emerged as an...
ICCAD
1994
IEEE
14 years 7 days ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...