1398 search results - page 128 / 280 » Application-Specific Integrated Circuits |
109
Voted
DATE
2010
IEEE
15 years 8 months ago
2010
IEEE
—Bug-free first silicon is not guaranteed by the existing pre-silicon verification techniques. To have impeccable products, it is now required to identify any bug as soon as the ...
116
Voted
DELTA
2002
IEEE
15 years 7 months ago
2002
IEEE
The European network for Integrated Circuit testing education described in this paper addresses the shortage of skill in mixed-signal production testing by encouraging students...
157
Voted
DAC
1997
ACM
15 years 7 months ago
1997
ACM
This paper describes a new design methodology to analyze the on-chip power supply noise for high performance microprocessors. Based on an integrated package-level and chip-level p...
137
Voted
ISLPED
1997
ACM
15 years 7 months ago
1997
ACM
With the increasing performance and density of VLSI circuits as well as the popularity of portable devices such as personal digital assistance, power consumption has emerged as an...
127
Voted
ICCAD
1994
IEEE
15 years 7 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...