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DAC
2004
ACM
14 years 9 months ago
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
Goeran Jerke, Jürgen Scheible, Jens Lienig
GLVLSI
2005
IEEE
122views VLSI» more  GLVLSI 2005»
14 years 1 months ago
Thermal aware cell-based full-chip electromigration reliability analysis
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...
Syed M. Alam, Donald E. Troxel, Carl V. Thompson
COMCOM
2006
154views more  COMCOM 2006»
13 years 8 months ago
Wireless sensor networks for personal health monitoring: Issues and an implementation
Recent technological advances in sensors, low-power integrated circuits, and wireless communications have enabled the design of lowcost, miniature, lightweight, and intelligent ph...
Aleksandar Milenkovic, Chris Otto, Emil Jovanov
INTEGRATION
2008
87views more  INTEGRATION 2008»
13 years 8 months ago
SafeResynth: A new technique for physical synthesis
Physical synthesis is a relatively young field in Electronic Design Automation. Many published optimizations for physical synthesis end up hurting the quality of the final design,...
Kai-Hui Chang, Igor L. Markov, Valeria Bertacco
VTS
2000
IEEE
95views Hardware» more  VTS 2000»
14 years 15 days ago
Word Voter: A New Voter Design for Triple Modular Redundant Systems
Redundancy techniques are commonly used to design dependable systems to ensure high reliability, availability and data integrity. Triple Modular Redundancy (TMR) is a widely used ...
Subhasish Mitra, Edward J. McCluskey