As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
Nuno Alves, Jennifer Dworak, R. Iris Bahar, Kundan...
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
John Hu, Mark Haffner, Samantha Yoder, Mark Scott,...
Emerging memory technologies such as STT-RAM, PCRAM, and resistive RAM are being explored as potential replacements to existing on-chip caches or main memories for future multi-co...
Asit K. Mishra, Xiangyu Dong, Guangyu Sun, Yuan Xi...
In this paper, we construct a price index for broadband services in the United States between 2004 and 2009. We analyze over 1500 service contracts offered by DSL and cable provid...
In floating-point datapaths synthesized on FPGAs, the shifters that perform mantissa alignment and normalization consume a disproportionate number of LUTs. Shifters are implemente...
Yehdhih Ould Mohammed Moctar, Nithin George, Hadi ...