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ICSE
2008
IEEE-ACM
14 years 8 months ago
The effect of program and model structure on mc/dc test adequacy coverage
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
JITE
2008
79views more  JITE 2008»
13 years 7 months ago
Effectiveness of Program Visualization: A Case Study with the ViLLE Tool
Teemu Rajala, Mikko-Jussi Laakso, Erkki Kaila, Tap...