1520 search results - page 77 / 304 » Applying adaptation design patterns |
DFT
2006
IEEE
14 years 2 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
ICMCS
2006
IEEE
14 years 2 months ago
2006
IEEE
Pattern mining algorithms are often much easier applied than quantitatively assessed. In this paper we address the pattern evaluation problem by looking at both the capability of ...
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
Book
"The documentation is missing or obsolete, and the original developers have departed. Your team has limited understanding of the system, and unit tests are missing for many, i...
ICIP
2006
IEEE
14 years 10 months ago
2006
IEEE
We present in this paper a method for implementing moment functions in a CMOS retina for shape recognition applications. The method is based on the use of binary patterns and it a...