This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
Pattern mining algorithms are often much easier applied than quantitatively assessed. In this paper we address the pattern evaluation problem by looking at both the capability of ...
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
"The documentation is missing or obsolete, and the original developers have departed. Your team has limited understanding of the system, and unit tests are missing for many, i...
We present in this paper a method for implementing moment functions in a CMOS retina for shape recognition applications. The method is based on the use of binary patterns and it a...
Olivier Aubreton, Lew Fock Chong Lew Yan Voon, Guy...