6315 search results - page 1095 / 1263 » Approximating Solution Structure |
115
Voted
DATE
2010
IEEE
15 years 7 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
129
Voted
DATE
2010
IEEE
15 years 7 months ago
2010
IEEE
This paper addresses the problem of stochastic task execution time estimation agnostic to the process distributions. The proposed method is orthogonal to the application structure ...
115
click to vote
GLVLSI
2010
IEEE
15 years 7 months ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
109
click to vote
COMPSAC
2002
IEEE
15 years 7 months ago
2002
IEEE
Component-based reuse is a hopeful solution to the software crisis. Research on software architecture (SA) has revealed a component-based vision of the gross structure of software...
100
click to vote
DSD
2002
IEEE
15 years 7 months ago
2002
IEEE
We discuss the gap we experience in an industrial design path of high-speed packet switches. As bandwidth demand exceeds progress in CMOS technology, system architects are forced ...