Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
This paper proposes an original model of the execution time of assembly instructions in superscalar architectures. The approach is based on a rigorous mathematical model and provi...
William Fornaciari, Vito Trianni, Carlo Brandolese...
This paper reports work to support dependability arguments about the future reliability of a product before there is direct empirical evidence. We develop a method for estimating ...
A robust statistics approach to curvature estimation on discretely sampled surfaces, namely polygon meshes and point clouds, is presented. The method exhibits accuracy, stability ...
Evangelos Kalogerakis, Patricio D. Simari, Derek N...
Abstract—Peer-to-peer storage systems aim to provide a reliable long-term storage at low cost. In such systems, peers fail continuously, hence, the necessity of self-repairing me...