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GLVLSI
2007
IEEE
194views VLSI» more  GLVLSI 2007»
13 years 11 months ago
Probabilistic maximum error modeling for unreliable logic circuits
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
Karthikeyan Lingasubramanian, Sanjukta Bhanja
ISSS
2002
IEEE
106views Hardware» more  ISSS 2002»
14 years 12 days ago
Modeling Assembly Instruction Timing in Superscalar Architectures
This paper proposes an original model of the execution time of assembly instructions in superscalar architectures. The approach is based on a rigorous mathematical model and provi...
William Fornaciari, Vito Trianni, Carlo Brandolese...
DSN
2002
IEEE
14 years 13 days ago
Process Modelling to Support Dependability Arguments
This paper reports work to support dependability arguments about the future reliability of a product before there is direct empirical evidence. We develop a method for estimating ...
Robin E. Bloomfield, Sofia Guerra
SGP
2007
13 years 10 months ago
Robust statistical estimation of curvature on discretized surfaces
A robust statistics approach to curvature estimation on discretely sampled surfaces, namely polygon meshes and point clouds, is presented. The method exhibits accuracy, stability ...
Evangelos Kalogerakis, Patricio D. Simari, Derek N...
P2P
2009
IEEE
137views Communications» more  P2P 2009»
14 years 2 months ago
Analysis of Failure Correlation Impact on Peer-to-Peer Storage Systems
Abstract—Peer-to-peer storage systems aim to provide a reliable long-term storage at low cost. In such systems, peers fail continuously, hence, the necessity of self-repairing me...
Olivier Dalle, Frédéric Giroire, Jul...