Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
In this article we explore techniques to detect and visualize features in data from molecular dynamics (MD) simulations. Although the techniques proposed are general, we focus on ...
John Wilkins, Kaden Hazzard, Raghu Machiraju, Same...
Transistor leakage is poised to become the dominant source of power dissipation in digital systems, and reconfigurable devices are not immune to this problem. Modern FPGAs already...
This paper introduces declarative event patterns (DEPs) as a means to implement protocols while improving their traceability, comprehensibility, and maintainability. DEPs are desc...
Top-k processing in uncertain databases is semantically and computationally different from traditional top-k processing. The interplay between query scores and data uncertainty ma...
Mohamed A. Soliman, Ihab F. Ilyas, Kevin Chen-Chua...