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Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
VIS
2004
IEEE
14 years 10 months ago
2004
IEEE
In this article we explore techniques to detect and visualize features in data from molecular dynamics (MD) simulations. Although the techniques proposed are general, we focus on ...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
Transistor leakage is poised to become the dominant source of power dissipation in digital systems, and reconfigurable devices are not immune to this problem. Modern FPGAs already...
SIGSOFT
2004
ACM
14 years 9 months ago
2004
ACM
This paper introduces declarative event patterns (DEPs) as a means to implement protocols while improving their traceability, comprehensibility, and maintainability. DEPs are desc...
SIGMOD
2007
ACM
14 years 9 months ago
2007
ACM
Top-k processing in uncertain databases is semantically and computationally different from traditional top-k processing. The interplay between query scores and data uncertainty ma...