6 search results - page 1 / 2 » Area Fill Generation With Inherent Data Volume Reduction |
DATE
2003
IEEE
14 years 4 months ago
2003
IEEE
Control of variability and performance in the back end of the VLSI manufacturing line has become extremely difficult with the introduction of new materials such as copper and low...
TCAD
2002
13 years 10 months ago
2002
Chemical-mechanical polishing (CMP) and other manufacturing steps in very deep submicron VLSI have varying effects on device and interconnect features, depending on local character...
SIGMOD
2008
ACM
14 years 11 months ago
2008
ACM
As applications within and outside the enterprise encounter increasing volumes of unstructured data, there has been renewed interest in the area of information extraction (IE) ? t...
ICS
2000
Tsinghua U.
14 years 2 months ago
2000
Tsinghua U.
Processing and analyzing large volumes of data plays an increasingly important role in many domains of scienti c research. High-level language and compiler support for developing ...
IPPS
2003
IEEE
14 years 4 months ago
2003
IEEE
With the availability of large datasets in a variety of scientific and commercial domains, data mining has emerged as an important area within the last decade. Data mining techni...