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ICCAD
2006
IEEE
152views Hardware» more  ICCAD 2006»
14 years 4 months ago
Performance-oriented statistical parameter reduction of parameterized systems via reduced rank regression
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...
Zhuo Feng, Peng Li
ICCAD
2006
IEEE
122views Hardware» more  ICCAD 2006»
14 years 4 months ago
Fill for shallow trench isolation CMP
Shallow trench isolation (STI) is the mainstream CMOS isolation technology. It uses chemical mechanical planarization (CMP) to remove excess of deposited oxide and attain a planar...
Andrew B. Kahng, Puneet Sharma, Alexander Zelikovs...
WWW
2010
ACM
14 years 2 months ago
Exploiting social context for review quality prediction
Online reviews in which users publish detailed commentary about their experiences and opinions with products, services, or events are extremely valuable to users who rely on them ...
Yue Lu, Panayiotis Tsaparas, Alexandros Ntoulas, L...
COMPSAC
2009
IEEE
14 years 2 months ago
Towards Validating Security Protocol Deployment in the Wild
As computing technology becomes increasingly pervasive and interconnected, mobility leads to shorter-lasting relationships between end-points with many different security requirem...
Luca Compagna, Ulrich Flegel, Volkmar Lotz
DATE
2009
IEEE
244views Hardware» more  DATE 2009»
14 years 2 months ago
Contactless testing: Possibility or pipe-dream?
The traditionally wired interfaces of many electronic systems are in many applications being replaced by wireless interfaces. Testing of electronic systems (both integrated circui...
Erik Jan Marinissen, Dae Young Lee, John P. Hayes,...