456 search results - page 64 / 92 » Automated Generation of Context-Aware Tests |
ITC
2002
IEEE
14 years 9 days ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...
CONCUR
2006
Springer
13 years 11 months ago
2006
Springer
We describe an incomplete but sound and efficient livelock freedom test for infinite state asynchronous reactive systems. The method s a system into a set of simple control flow cy...
IJSEKE
2011
12 years 10 months ago
2011
rather wide gap in abstraction between policies and mechanisms. In this paper, we propose a general approach for property verification for MAC models. The approach defines a stan...
PLDI
2011
ACM
12 years 10 months ago
2011
ACM
Compilers should be correct. To improve the quality of C compilers, we created Csmith, a randomized test-case generation tool, and spent three years using it to find compiler bug...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...