1414 search results - page 154 / 283 » Automated Metamorphic Testing |
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—Daily experience with product designers, test and diagnosis engineers it is realized that the depth of interaction among them, ought be high for sucessfull diagnosis of analogue...
ITNG
2010
IEEE
14 years 2 months ago
2010
IEEE
—This paper presents the design of BAUT, a tutoring system that explores statistical approach for providing instant project failure analysis. Driven by a Bayesian Network (BN) in...
ITC
2002
IEEE
14 years 2 months ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...
ICSE
2001
IEEE-ACM
14 years 1 months ago
2001
IEEE-ACM
Extreme Programming (XP) is a new and controversial sojiware processfor small teams. A practical training courseat the universityof Karlsruheled to thefollowing observations about...
ISSTA
1993
ACM
14 years 1 months ago
1993
ACM
Mutation analysis is a powerful technique for assessing and improving the quality of test data used to unit test software. Unfortunately, current automated mutation analysis syste...