1414 search results - page 212 / 283 » Automated Metamorphic Testing |
AMOST
2007
ACM
13 years 11 months ago
2007
ACM
Model-checkers have recently been suggested for automated software test-case generation. Several works have presented methods that create efficient test-suites using model-checker...
DLOG
1998
13 years 9 months ago
1998
Effective systems for expressive description logics require a heavily-optimised subsumption checker incorporating a range of optimisation techniques. Because of the correspondence...
FTCS
1993
13 years 9 months ago
1993
Although the present work does in fact employ training data, it does so in the interest of calibrating the results Six hundred faults were induced by injection into five live obtai...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...