1414 search results - page 217 / 283 » Automated Metamorphic Testing |
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
In this work, we present a new optical routing framework, O-Router for future low-power on-chip optical interconnect integration utilizing silicon compatible nano-photonic devices...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
In recent literature it has been reported that Dynamic Power Management (DPM) may lead to decreased reliability in real-time embedded systems. The ever-shrinking device sizes cont...