1414 search results - page 222 / 283 » Automated Metamorphic Testing |
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
MICCAI
2003
Springer
14 years 8 months ago
2003
Springer
A robust and automatic system has been developed to detect the visual axis and extract important feature landmarks from slit-lamp photographs, and objectively grade the severity of...
MICCAI
2005
Springer
14 years 8 months ago
2005
Springer
Abstract. This paper presents a robust and fully automated registration algorithm for registration of images of Quadrature Tomographic Microscopy (QTM), which is an optical interfe...
ICML
2000
IEEE
14 years 8 months ago
2000
IEEE
This paper describes Pairwise Bisection: a nonparametric approach to optimizing a noisy function with few function evaluations. The algorithm uses nonparametric reasoning about si...
ICSE
2009
IEEE-ACM
14 years 8 months ago
2009
IEEE-ACM
Automatic repair of programs has been a longstanding goal in software engineering, yet debugging remains a largely manual process. We introduce a fully automated method for locati...