119 search results - page 21 / 24 » Automated Modeling of Custom Digital Circuits for Test |
ICCAD
2003
IEEE
14 years 5 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
FPL
2001
Springer
14 years 1 months ago
2001
Springer
Abstract. Visual data
ow environments are ideally suited for modeling digital signal processing (DSP) systems, as many DSP algorithms are most naturally speci ed by signal
ow gra...
3DGIS
2006
Springer
14 years 2 months ago
2006
Springer
Abstract Three-dimensional (3D) building model is one of the most important components in a cyber city implementation and application. This study developed an effective and highly ...
KDD
2009
ACM
14 years 9 months ago
2009
ACM
Controlled experiments, also called randomized experiments and A/B tests, have had a profound influence on multiple fields, including medicine, agriculture, manufacturing, and adv...
KR
1992
Springer
14 years 18 days ago
1992
Springer
While it has been realized for quite some time within AI that abduction is a general model of explanation for a variety of tasks, there have been no empirical investigations into ...