4359 search results - page 797 / 872 » Automated Pipeline Design |
DAC
2008
ACM
14 years 10 months ago
2008
ACM
In this paper, we present ELIAD, an efficient lithography aware detailed router to optimize silicon image after optical proximity correction (OPC) in a correct-by-construction man...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
Intrinsic and parasitic capacitances play an important role in determining the high?frequency RF performance of devices. Recently, a new type of carbon nanotube field effect trans...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
Current source based cell models are becoming a necessity for accurate timing and noise analysis at 65nm and below. Voltage waveform shapes are increasingly more difficult to repr...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...