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DAC
2008
ACM
14 years 8 months ago
Merging nodes under sequential observability
This paper presents a new type of sequential technology independent synthesis. Building on the previous notions of combinational observability and sequential equivalence, sequenti...
Michael L. Case, Victor N. Kravets, Alan Mishchenk...
ISSRE
2003
IEEE
14 years 18 days ago
Test-Driven Development as a Defect-Reduction Practice
Test-driven development is a software development practice that has been used sporadically for decades. With this practice, test cases (preferably automated) are incrementally wri...
Laurie A. Williams, E. Michael Maximilien, Mladen ...
DAC
2007
ACM
14 years 8 months ago
An Embedded Multi-resolution AMBA Trace Analyzer for Microprocessor-based SoC Integration
The bus tracing is used to catch related signals for further investigation and analysis. However, the trace size of cycleaccurate tracing is large and the trace cycle is shallow u...
Chung-Fu Kao, Ing-Jer Huang, Chi-Hung Lin
DAC
2004
ACM
14 years 8 months ago
Exploiting structure in symmetry detection for CNF
Instances of the Boolean satisfiability problem (SAT) arise in many areas of circuit design and verification. These instances are typically constructed from some human-designed ar...
Paul T. Darga, Mark H. Liffiton, Karem A. Sakallah...
CADE
2006
Springer
14 years 7 months ago
Solving Sparse Linear Constraints
Linear arithmetic decision procedures form an important part of theorem provers for program verification. In most verification benchmarks, the linear arithmetic constraints are dom...
Shuvendu K. Lahiri, Madanlal Musuvathi