615 search results - page 29 / 123 » Automated Test Case Generation from Dynamic Models |
ITC
1999
IEEE
13 years 12 months ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
ICML
2009
IEEE
14 years 2 months ago
2009
IEEE
Virtually all methods of learning dynamic systems from data start from the same basic assumption: that the learning algorithm will be provided with a sequence, or trajectory, of d...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or...
ACSAC
2001
IEEE
13 years 11 months ago
2001
IEEE
Vulnerabilities in distributed applications are being uncovered and exploited faster than software engineers can patch the security holes. All too often these weaknesses result fr...
ICRA
2010
IEEE
13 years 6 months ago
2010
IEEE
— Data collection using Autonomous Underwater Vehicles (AUVs) is increasing in importance within the oceanographic research community. Contrary to traditional moored or static pl...