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DAC
2009
ACM
14 years 11 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
DAC
2009
ACM
14 years 11 months ago
2009
ACM
Post-silicon processor debugging is frequently carried out in a loop consisting of several iterations of the following two key steps: (i) processor execution for some duration, fo...
DAC
2009
ACM
14 years 11 months ago
2009
ACM
This paper presents a technique to improve the storage density of spin-torque transfer (STT) magnetoresistive random access memory (MRAM) in the presence of significant magnetic t...
DAC
2009
ACM
14 years 11 months ago
2009
ACM
Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem...
DAC
2008
ACM
14 years 11 months ago
2008
ACM
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...