3424 search results - page 635 / 685 » Automated Testing of Classes |
DAC
2005
ACM
14 years 11 months ago
2005
ACM
As feature sizes shrink, transient failures of on-chip network links become a critical problem. At the same time, many applications require guarantees on both message arrival prob...
DAC
2005
ACM
14 years 11 months ago
2005
ACM
We propose a system architecture for real-time hardware speech recognition on low-cost, power-constrained devices. The system is intended to support real-time speech-based user in...
DAC
2005
ACM
14 years 11 months ago
2005
ACM
We present an efficient optimization scheme for gate sizing in the presence of process variations. Using a posynomial delay model, the delay constraints are modified to incorporat...
DAC
2006
ACM
14 years 11 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
SIGSOFT
2009
ACM
14 years 10 months ago
2009
ACM
Debugging refers to the laborious process of finding causes of program failures. Often, such failures are introduced when a program undergoes changes and evolves from a stable ver...