106 search results - page 13 / 22 » Automated data analysis solutions to silicon debug |
ASAP
2011
IEEE
12 years 6 months ago
2011
IEEE
—The domain of vision and navigation often includes applications for feature tracking as well as simultaneous localization and mapping (SLAM). As these problems require computati...
DAC
2006
ACM
14 years 7 months ago
2006
ACM
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...
DAC
2003
ACM
14 years 7 months ago
2003
ACM
We present in this paper a multilevel floorplanning/placement framework based on the B*-tree representation, called MB*-tree, to handle the floorplanning and packing for large-sca...
GIS
1999
ACM
13 years 11 months ago
1999
ACM
Frameworks and Patterns are important instruments that enable the reuse of successful software solutions in recurrent problems. Geographic information systems, on the other hand, ...
ISSTA
2004
ACM
14 years 4 days ago
2004
ACM
Evolutionary testing is an effective technique for automatically generating good quality test data. However, for structural testing, the technique degenerates to random testing i...