117 search results - page 11 / 24 » Automated path generation for software fault localization |
VTS
1997
IEEE
13 years 11 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
ICECCS
2002
IEEE
14 years 15 days ago
2002
IEEE
This paper describes the application of the Test Automation Framework on the Mars Polar Lander (MPL) software. The premature shutdown of the descent engine on the MPL spacecraft i...
AOSE
2008
Springer
13 years 9 months ago
2008
Springer
Abstract. Software agents are a promising technology for today's complex, distributed systems. Methodologies and techniques that address testing and reliability of multi agent...
PLDI
2005
ACM
14 years 1 months ago
2005
ACM
We present a new tool, named DART, for automatically testing software that combines three main techniques: (1) automated extraction of the interface of a program with its external...