117 search results - page 6 / 24 » Automated path generation for software fault localization |
DSN
2002
IEEE
14 years 15 days ago
2002
IEEE
A virtual duplex system (VDS) can be used to increase safety without the use of structural redundancy on a single machine. If a deterministic program P is calculating a given func...
ICST
2010
IEEE
13 years 6 months ago
2010
IEEE
—When a program is modified during software evolution, developers typically run the new version of the program against its existing test suite to validate that the changes made ...
DATE
1998
IEEE
13 years 11 months ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
KBSE
2009
IEEE
14 years 2 months ago
2009
IEEE
—We investigate claims and assumptions made in several recent papers about fault localization (FL) techniques. Most of these claims have to do with evaluating FL accuracy. Our in...
IOLTS
2000
IEEE
13 years 12 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...