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ICCD
2004
IEEE
134views Hardware» more  ICCD 2004»
14 years 4 months ago
An Automatic Test Pattern Generation Framework for Combinational Threshold Logic Networks
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
Pallav Gupta, Rui Zhang, Niraj K. Jha
IUI
2011
ACM
12 years 10 months ago
Automatically generating stories from sensor data
Recent research in Augmented and Alternative Communication (AAC) has begun to make use of Natural Language Generation (NLG) techniques. This creates an opportunity for constructin...
Joseph Reddington, Nava Tintarev
SDL
2003
158views Hardware» more  SDL 2003»
13 years 9 months ago
Automatic Formal Model Generation and Analysis of SDL
A tool for verification of distributed systems defined using standard SDL-96 is described. The SDL description is automatically translated into a high-level Petri net model which...
Annikka Aalto, Nisse Husberg, Kimmo Varpaaniemi
DATE
2006
IEEE
126views Hardware» more  DATE 2006»
14 years 1 months ago
Communication and co-simulation infrastructure for heterogeneous system integration
With the increasing complexity and heterogeneity of embedded electronic systems, a unified design methodology at evels of abstraction becomes a necessity. Meanwhile, it is also i...
Guang Yang 0004, Xi Chen, Felice Balarin, Harry Hs...
MTV
2005
IEEE
138views Hardware» more  MTV 2005»
14 years 1 months ago
Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
Paolo Bernardi, Ernesto Sánchez, Massimilia...