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TAP
2007
Springer
64views Hardware» more  TAP 2007»
15 years 10 months ago
Using Contracts and Boolean Queries to Improve the Quality of Automatic Test Generation
Lisa (Ling) Liu, Bertrand Meyer, Bernd Schoeller
IPPS
2006
IEEE
15 years 10 months ago
VHDL to FPGA automatic IP-Core generation: a case study on Xilinx design flow
Fabrizio Ferrandi, G. Ferrara, R. Palazzo, Vincenz...