Sciweavers

247 search results - page 2 / 50
» Automatic Test Data Generation Using Constraint Solving Tech...
Sort
View
GECCO
2004
Springer
145views Optimization» more  GECCO 2004»
14 years 28 days ago
Search Based Automatic Test-Data Generation at an Architectural Level
Abstract. The need for effective testing techniques for architectural level descriptions is widely recognised. However, due to the variety of domain-specific architectural descript...
Yuan Zhan, John A. Clark
COMPSAC
2005
IEEE
14 years 1 months ago
Goal-Oriented Test Data Generation for Programs with Pointer Variables
Automatic test data generation leads to the identification of input values on which a selected path or a selected branch is executed within a program (path-oriented vs goalorient...
Arnaud Gotlieb, Tristan Denmat, Bernard Botella
CPP
2011
98views more  CPP 2011»
12 years 7 months ago
Automatically Verifying Typing Constraints for a Data Processing Language
Abstract. In this paper we present a new technique for automatically verifying typing constraints in the setting of Dminor, a first-order data processing language with refinement...
Michael Backes, Catalin Hritcu, Thorsten Tarrach
DAC
1999
ACM
13 years 12 months ago
Test Generation for Gigahertz Processors Using an Automatic Functional Constraint Extractor
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. ...
ET
2000
145views more  ET 2000»
13 years 7 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar