315 search results - page 10 / 63 » Automatic generation of high coverage usability tests |
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
The single stuck-at fault coverage is often seen as a figure-of-merit also for scan testing according to other fault models like transition faults, bridging faults, crosstalk faul...
EVOW
2008
Springer
13 years 9 months ago
2008
Springer
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
GECCO
2007
Springer
14 years 1 months ago
2007
Springer
It is not unusual for a software development organization to expend 40 percent of total project effort on testing, which can be a very laborious and time-consuming process. Thus, ...
VTS
2002
IEEE
14 years 20 days ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
ISSTA
2006
ACM
14 years 1 months ago
2006
ACM
The popularity of object-oriented programming has led to the wide use of container libraries. It is important for the reliability of these containers that they are tested adequate...