315 search results - page 28 / 63 » Automatic generation of high coverage usability tests |
VLSI
2005
Springer
14 years 1 months ago
2005
Springer
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
KBSE
2005
IEEE
14 years 1 months ago
2005
IEEE
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
DAC
1997
ACM
14 years 1 hour ago
1997
ACM
We examine frequency-domain issues in the design and selection of on-chip test generators for built-in self-test (BIST) of highperformance digital filters. Test-generator/circuit...
TOOLS
2010
IEEE
14 years 27 days ago
2010
IEEE
JSContest is a tool that enhances JavaScript with simple, type-like contracts and provides a framework for monitoring and guided random testing of programs against these contracts ...
ASPDAC
2009
ACM
14 years 2 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...