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GLVLSI
2008
IEEE
128views VLSI» more  GLVLSI 2008»
14 years 1 months ago
NBTI-aware flip-flop characterization and design
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
Hamed Abrishami, Safar Hatami, Behnam Amelifard, M...
SPLC
2008
13 years 8 months ago
Automated Diagnosis of Product-Line Configuration Errors in Feature Models
Feature models are widely used to model software product-line (SPL) variability. SPL variants are configured by selecting feature sets that satisfy feature model constraints. Conf...
Jules White, Douglas C. Schmidt, David Benavides, ...
ACL
1998
13 years 8 months ago
Compacting the Penn Treebank Grammar
Treebanks, such as the Penn Treebank (PTB), offer a simple approach to obtaining a broad coverage grammar: one can simply read the grammar off the parse trees in the treebank. Whi...
Alexander Krotov, Mark Hepple, Robert J. Gaizauska...
DATE
2008
IEEE
134views Hardware» more  DATE 2008»
14 years 1 months ago
Adaptive Filesystem Compression for Embedded Systems
Abstract—Embedded system secondary storage size is often constrained, yet storage demands are growing as a result of increasing application complexity and storage of personal dat...
Lan S. Bai, Haris Lekatsas, Robert P. Dick
JSS
2010
136views more  JSS 2010»
13 years 2 months ago
Automated diagnosis of feature model configurations
Software product-lines (SPLs) are software architectures that can be readily reconfigured for different project requirements. A key part of an SPL is a model that captures the rul...
Jules White, David Benavides, Douglas C. Schmidt, ...