137 search results - page 7 / 28 » Automatic thresholding for defect detection |
BPM
2008
Springer
13 years 10 months ago
2008
Springer
Abstract. Many work has been conducted to analyze service choreographies to assert manyfold correctness criteria. While errors can be detected automatically, the correction of defe...
VTS
2008
IEEE
14 years 3 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
ITC
2000
IEEE
14 years 29 days ago
2000
IEEE
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...
MVA
2007
13 years 10 months ago
2007
A two-dimensional (2-D) convolution mask is proposed for detecting the location of irregularities and defects in a periodic two-dimensional signal or image. In this approach, defe...
ICIP
2007
IEEE
14 years 10 months ago
2007
IEEE
A considerable amount of work in larger film and video restoration projects is dedicated to manually exploring the audiovisual content in order to estimate the costs for restorati...