12 search results - page 1 / 3 » Automating post-silicon debugging and repair |
ATS
2010
IEEE
13 years 9 months ago
2010
IEEE
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
DATE
2008
IEEE
14 years 5 months ago
2008
IEEE
When searching for functional bugs in silicon, debug data is acquired after a trigger event occurs. A trigger event can be configured at run-time using a set of control registers...
ICCAD
2007
IEEE
14 years 7 months ago
2007
IEEE
Modern IC designs have reached unparalleled levels of complexity, resulting in more and more bugs discovered after design tape-out However, so far only very few EDA tools for post...
KBSE
2009
IEEE
14 years 5 months ago
2009
IEEE
—Automated debugging is becoming increasingly important as the size and complexity of software increases. This paper makes a case for using constraint-based data structure repair...
DAC
2009
ACM
14 years 12 months ago
2009
ACM
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...