12745 search results - page 2352 / 2549 » Automating test automation |
127
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
138
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures. To improve via yield and reliability, redundant-via insertion is a highl...
133
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
Deploying multiple supply voltages (multi-Vdds) on one chip is an important technique to reduce dynamic power consumption. In this work we present an optimality study for resource...
168
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
Most existing dynamic voltage scaling (DVS) schemes for multiple tasks assume an energy cost function (energy consumption versus execution time) that is independent of the task ch...
154
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
In this paper, we propose a new global router, BoxRouter, powered by the concept of box expansion and progressive integer linear programming (ILP). BoxRouter first uses a simple P...