233 search results - page 28 / 47 » Balance Testing of Logic Circuits |
ATS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
GLVLSI
2003
IEEE
14 years 25 days ago
2003
IEEE
With scaling down to deep submicron and nanometer technologies, noise immunity is becoming a metric of the same importance as power, speed, and area. Smaller feature sizes, low vo...
DATE
2010
IEEE
13 years 11 months ago
2010
IEEE
─ Error tolerance formally captures the notion that – for a wide variety of applications including audio, video, graphics, and wireless communications – a defective chip that...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
Tri-state buses and pass transistor logic are used in many complex applications to achieve high performance and small area. Such circuits often contain logic requiring one-hot sig...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
We present an efficient search strategy for satisfiability checking on circuits represented at the register-transfer-level (RTL). We use the RTL circuit structure by extending con...