233 search results - page 29 / 47 » Balance Testing of Logic Circuits |
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
DAC
1990
ACM
13 years 11 months ago
1990
ACM
Symbolic simulation involves evaluating circuit behavior using special symbolic values to encode a range of circuit operating conditions. In one simulation run, a symbolic simulat...
ISPD
2005
ACM
14 years 1 months ago
2005
ACM
Placement is a critical component of today's physical synthesis flow with tremendous impact on the final performance of VLSI designs. However, it accounts for a significant p...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...