Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
This paper addresses the issue of effective and efficient content based image retrieval by presenting a novel indexing and retrieval methodology that integrates color, texture, an...
Abstract. Several types of logic gates suitable for leakage-proof computations have been put forward [1,2,3,4]. This paper describes a method, called “backend duplication” to a...
Sylvain Guilley, Philippe Hoogvorst, Yves Mathieu,...
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...
Michael E. Imhof, Hans-Joachim Wunderlich, Christi...