5604 search results - page 12 / 1121 » Becoming Increasingly Reliable |
ASPDAC
2009
ACM
14 years 5 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) is a leading reliability concern for integrated circuits (ICs). It gradually increases the threshold voltages of PMOS transistors, ...
IM
2003
14 years 8 days ago
2003
: Security of systems and management infrastructure is crucial for a successful, reliable and safe use. Most currently deployed systems are based on simple subject/object-relations...
DAC
2006
ACM
14 years 12 months ago
2006
ACM
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
KBSE
2009
IEEE
14 years 5 months ago
2009
IEEE
—Web applications are increasingly becoming the most important platform for software applications in industry, with many modelling languages proposed to handle the complexity of ...
DAC
2009
ACM
14 years 12 months ago
2009
ACM
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...