1242 search results - page 131 / 249 » Benchmark Analysis with FaCT |
DDECS
2008
IEEE
14 years 4 months ago
2008
IEEE
— Due to ever increasing design sizes more efficient tools for Automatic Test Pattern Generation (ATPG) are needed. Recently ATPG based on Boolean satisfiability (SAT) has been ...
ICPR
2008
IEEE
14 years 4 months ago
2008
IEEE
This paper presents a new algorithm named Kernel Bisecting k-means and Sample Removal (KBK-SR) as a sampling preprocessing for SVM training to improve the scalability. The novel c...
TASE
2008
IEEE
14 years 4 months ago
2008
IEEE
In this paper, we propose a fine-grained coupling metrics suite for aspect-oriented (AO) systems, to measure software changes during system evolution. We also present a correlati...
DDECS
2007
IEEE
14 years 4 months ago
2007
IEEE
– The implementation and the fault simulation technique for the highly reliable digital design using two FPGAs under a processor control is presented. Two FPGAs are used for dupl...
ISQED
2007
IEEE
14 years 4 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...