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TCAD
2008
88views more  TCAD 2008»
13 years 8 months ago
Self-Adaptive Data Caches for Soft-Error Reliability
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches' dominant share in die area and tr...
Shuai Wang, Jie S. Hu, Sotirios G. Ziavras
TEC
2008
100views more  TEC 2008»
13 years 8 months ago
Real-Valued Compact Genetic Algorithms for Embedded Microcontroller Optimization
Recent research on compact genetic algorithms (cGAs) has proposed a number of evolutionary search methods with reduced memory requirements. In cGAs, the evolution of populations is...
Ernesto Mininno, Francesco Cupertino, David Naso
JAR
2007
97views more  JAR 2007»
13 years 8 months ago
Debugging Incoherent Terminologies
Abstract. In this paper we study the diagnosis and repair of incoherent terminologies. We define a number of new non-standard reasoning services to explain incoherence through pin...
Stefan Schlobach, Zhisheng Huang, Ronald Cornet, F...
TCAD
1998
91views more  TCAD 1998»
13 years 8 months ago
Cost-free scan: a low-overhead scan path design
Conventional scan design imposes considerable area and delay overhead by using larger scan ip- ops and additional scan wires without utilizing the functionality of the combinatio...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Mike Ti...
TISSEC
2002
75views more  TISSEC 2002»
13 years 8 months ago
Termination in language-based systems
Language runtime systems are increasingly being embedded in systems to support runtime extensibility via mobile code. Such systems raise a number of concerns when the code running...
Algis Rudys, Dan S. Wallach