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DAC
2008
ACM
14 years 10 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
WWW
2007
ACM
14 years 9 months ago
Long distance wireless mesh network planning: problem formulation and solution
Several research efforts as well as deployments have chosen IEEE 802.11 as a low-cost, long-distance access technology to bridge the digital divide. In this paper, we consider the...
Sayandeep Sen, Bhaskaran Raman
KDD
2009
ACM
172views Data Mining» more  KDD 2009»
14 years 9 months ago
Towards combining web classification and web information extraction: a case study
: ? Towards Combining Web Classification and Web Information Extraction: a Case Study Ping Luo, Fen Lin, Yuhong Xiong, Yong Zhao, Zhongzhi Shi HP Laboratories HPL-2009-86 Classific...
Ping Luo, Fen Lin, Yuhong Xiong, Yong Zhao, Zhongz...
KDD
2009
ACM
611views Data Mining» more  KDD 2009»
14 years 9 months ago
Fast approximate spectral clustering
Spectral clustering refers to a flexible class of clustering procedures that can produce high-quality clusterings on small data sets but which has limited applicability to large-s...
Donghui Yan, Ling Huang, Michael I. Jordan
PODS
2009
ACM
134views Database» more  PODS 2009»
14 years 9 months ago
An efficient rigorous approach for identifying statistically significant frequent itemsets
As advances in technology allow for the collection, storage, and analysis of vast amounts of data, the task of screening and assessing the significance of discovered patterns is b...
Adam Kirsch, Michael Mitzenmacher, Andrea Pietraca...