113 search results - page 18 / 23 » Biased Cost Pathfinding |
EVOW
1994
Springer
13 years 12 months ago
1994
Springer
One of the main problems in applying evolutionary optimisation methods is the choice of operators and parameter values. This paper propose a competitive evolution method, in which ...
ALMOB
2007
13 years 7 months ago
2007
Background: The optimal score for ungapped local alignments of infinitely long random sequences is known to follow a Gumbel extreme value distribution. Less is known about the imp...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
ISBI
2008
IEEE
14 years 8 months ago
2008
IEEE
We study the influence of the choice of template in tensorbased morphometry. Using 3D brain MR images from 10 monozygotic twin pairs, we defined a tensor-based distance in the log...
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...